A Testing Methodology for VHDL Based High-Level Designs

نویسندگان

  • Giacomo Buonanno
  • Fabrizio Ferrandi
  • Franco Fummi
  • Donatella Sciuto
  • Patrizia Cavalloro
چکیده

The test problem increasingly affects system design process, related costs and time to market. Requirements from VLSI/WSI manufacturers are for fast and reliable testability tools, with the possibility of their introduction in early phases of design. In this paper we describe the different abstraction levels at which testability analysis will be applied in the REQUEST Project. The global tool-set architecture supporting this analysis will be introduced and commented. All design phases are included in this design flow, from the Data Flow Graph/Control Flow Graph (CDFG/CFG) representations of behaviors (directly derived from VHDL behavioral specifications), down to gate level. The paper will then present an application scenario for the behavioral level, where most of the innovative features have been introduced, including a new behavioral fault model strictly related to the lower levels of abstraction.

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تاریخ انتشار 2008